Superhydrophobic polytetrafluoroethylene thin films with hierarchical roughness deposited using a single step vapor phase technique

    Authors

    S. Gupta; A. C. Arjunan; S. Deshpande; S. Seal; D. Singh;R. K. Singh

    Comments

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    Abbreviated Journal Title

    Thin Solid Films

    Keywords

    Polytetrafluoroethylene; Pulsed electron deposition; Superhydrophobicity; Dual-scale roughness; Thin films; Atomic force; microscopy; CONTACT-ANGLE; SURFACE; FABRICATION; POLYMER; POLY(TETRAFLUOROETHYLENE); HYDROPHOBICITY; MORPHOLOGY; DROPLETS; ADHESION; CREATION; Materials Science, Multidisciplinary; Materials Science, Coatings &; Films; Physics, Applied; Physics, Condensed Matter

    Abstract

    Superhydrophobic polytetrafluoroethylene films with hierarchical surface roughness were deposited using pulse electron deposition technique. We were able to modulate roughness of the deposited films by controlling the beam energy and hence the electron penetration depth. The films deposited at higher beam energy showed contact angle as high as 166 degrees. The scanning electron and atomic force microscope studies revealed clustered growth and two level sub-micron asperities on films deposited at higher energies. Such dual-scale hierarchical roughness and heterogeneities at the water-surface interface was attributed to the observed contact angle and thus its superhydrophobic nature. Published by Elsevier B.V.

    Journal Title

    Thin Solid Films

    Volume

    517

    Issue/Number

    16

    Publication Date

    1-1-2009

    Document Type

    Article

    Language

    English

    First Page

    4555

    Last Page

    4559

    WOS Identifier

    WOS:000267110200011

    ISSN

    0040-6090

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