Title

Superhydrophobic polytetrafluoroethylene thin films with hierarchical roughness deposited using a single step vapor phase technique

Authors

Authors

S. Gupta; A. C. Arjunan; S. Deshpande; S. Seal; D. Singh;R. K. Singh

Comments

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Abbreviated Journal Title

Thin Solid Films

Keywords

Polytetrafluoroethylene; Pulsed electron deposition; Superhydrophobicity; Dual-scale roughness; Thin films; Atomic force; microscopy; CONTACT-ANGLE; SURFACE; FABRICATION; POLYMER; POLY(TETRAFLUOROETHYLENE); HYDROPHOBICITY; MORPHOLOGY; DROPLETS; ADHESION; CREATION; Materials Science, Multidisciplinary; Materials Science, Coatings &; Films; Physics, Applied; Physics, Condensed Matter

Abstract

Superhydrophobic polytetrafluoroethylene films with hierarchical surface roughness were deposited using pulse electron deposition technique. We were able to modulate roughness of the deposited films by controlling the beam energy and hence the electron penetration depth. The films deposited at higher beam energy showed contact angle as high as 166 degrees. The scanning electron and atomic force microscope studies revealed clustered growth and two level sub-micron asperities on films deposited at higher energies. Such dual-scale hierarchical roughness and heterogeneities at the water-surface interface was attributed to the observed contact angle and thus its superhydrophobic nature. Published by Elsevier B.V.

Journal Title

Thin Solid Films

Volume

517

Issue/Number

16

Publication Date

1-1-2009

Document Type

Article

Language

English

First Page

4555

Last Page

4559

WOS Identifier

WOS:000267110200011

ISSN

0040-6090

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