Title

Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness (vol 427, pg 232, 2006)

Authors

Authors

Y. F. Cao; S. Allameh; D. Nankivil; T. S. Sathiaraj; T. Otiti;W. Soboyejo

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

Mater. Sci. Eng. A-Struct. Mater. Prop. Microstruct. Process.

Keywords

Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Metallurgy & Metallurgical Engineering

Journal Title

Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing

Volume

494

Issue/Number

1-2

Publication Date

1-1-2008

Document Type

Correction

DOI Link

http://dx.doi.org/10.1016/j.msea.2008.06.002

Language

English

First Page

466

Last Page

466

WOS Identifier

WOS:000259983700066

ISSN

0921-5093

Recommended Citation

"Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness (vol 427, pg 232, 2006)" (2008). Faculty Bibliography 2000s. 172.
https://stars.library.ucf.edu/facultybib2000/172