Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness (vol 427, pg 232, 2006)

    Authors

    Y. F. Cao; S. Allameh; D. Nankivil; T. S. Sathiaraj; T. Otiti;W. Soboyejo

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abbreviated Journal Title

    Mater. Sci. Eng. A-Struct. Mater. Prop. Microstruct. Process.

    Keywords

    Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Metallurgy & Metallurgical Engineering

    Journal Title

    Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing

    Volume

    494

    Issue/Number

    1-2

    Publication Date

    1-1-2008

    Document Type

    Correction

    Language

    English

    First Page

    466

    Last Page

    466

    WOS Identifier

    WOS:000259983700066

    ISSN

    0921-5093

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