Title
A scanning photoemission microscope (SPEM) to study the interface chemistry of AlTi/C system
Abbreviated Journal Title
J. Mater. Sci. Lett.
Keywords
X-RAY MICROSCOPES; SPECTROMICROSCOPY; CARBON; METALS; Materials Science, Multidisciplinary
Journal Title
Journal of Materials Science Letters
Volume
19
Issue/Number
2
Publication Date
1-1-2000
Document Type
Article
Language
English
First Page
123
Last Page
126
WOS Identifier
ISSN
0261-8028
Recommended Citation
"A scanning photoemission microscope (SPEM) to study the interface chemistry of AlTi/C system" (2000). Faculty Bibliography 2000s. 2796.
https://stars.library.ucf.edu/facultybib2000/2796
COinS
Comments
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