A scanning photoemission microscope (SPEM) to study the interface chemistry of AlTi/C system

    Authors

    S. Seal; T. Warwick; N. Sobczak;J. Morgiel

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abbreviated Journal Title

    J. Mater. Sci. Lett.

    Keywords

    X-RAY MICROSCOPES; SPECTROMICROSCOPY; CARBON; METALS; Materials Science, Multidisciplinary

    Journal Title

    Journal of Materials Science Letters

    Volume

    19

    Issue/Number

    2

    Publication Date

    1-1-2000

    Document Type

    Article

    Language

    English

    First Page

    123

    Last Page

    126

    WOS Identifier

    WOS:000084868500010

    ISSN

    0261-8028

    Share

    COinS