Title

A scanning photoemission microscope (SPEM) to study the interface chemistry of AlTi/C system

Authors

Authors

S. Seal; T. Warwick; N. Sobczak;J. Morgiel

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

J. Mater. Sci. Lett.

Keywords

X-RAY MICROSCOPES; SPECTROMICROSCOPY; CARBON; METALS; Materials Science, Multidisciplinary

Journal Title

Journal of Materials Science Letters

Volume

19

Issue/Number

2

Publication Date

1-1-2000

Document Type

Article

Language

English

First Page

123

Last Page

126

WOS Identifier

WOS:000084868500010

ISSN

0261-8028

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