An improved electrostatic discharge protection structure for reducing triggering voltage and parasitic capacitance

    Authors

    X. F. Gao; J. J. Liou; W. S. Wong;S. Vishwanathan

    Abbreviated Journal Title

    Solid-State Electron.

    Keywords

    ESD PROTECTION; WELL; Engineering, Electrical & Electronic; Physics, Applied; Physics, ; Condensed Matter

    Abstract

    On-chip electrostatic discharge (ESD) protection structures are frequently used in microchips to protect the core circuit again ESD damages. Relatively large parasitic capacitances associated with these structures, however, can degrade the performance of microchips. In this paper, a new type of supply clamp is studied for the purpose of reducing the parasitic capacitance in ESD protection structures. The approach and physics of the new supply clamp are discussed, and both experimental data and device simulation are provided in support of the investigation. (C) 2003 Elsevier Science Ltd. All rights reserved.

    Journal Title

    Solid-State Electronics

    Volume

    47

    Issue/Number

    6

    Publication Date

    1-1-2003

    Document Type

    Article

    Language

    English

    First Page

    1105

    Last Page

    1110

    WOS Identifier

    WOS:000182277400026

    ISSN

    0038-1101

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