Abbreviated Journal Title
Opt. Express
Keywords
2-PHOTON ABSORPTION; SINGLE-BEAM; GENERATION; Optics
Abstract
We present a technique for rapid characterization of degenerate nonlinear absorption and refraction spectra using a femtosecond white-light continuum (WLC) pulse to perform Z-scans. The spectral components of the WLC source are temporally and spatially dispersed to minimize nondegenerate two-photon absorption (2PA) processes. We demonstrate the validity of the method by measuring the 2PA spectrum of a well-characterized semiconductor, ZnSe.
Journal Title
Optics Express
Volume
12
Issue/Number
16
Publication Date
1-1-2004
Document Type
Article
Language
English
First Page
3820
Last Page
3826
WOS Identifier
ISSN
1094-4087
Recommended Citation
Balu, Mihaela; Hales, Joel; Hagan, David J.; and Van Stryland, Eric W., "White-light continuum Z-scan technique for nonlinear materials characterization" (2004). Faculty Bibliography 2000s. 4196.
https://stars.library.ucf.edu/facultybib2000/4196
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