Authors

K. Barmak; J. Kim; L. H. Lewis; K. R. Coffey; M. F. Toney; A. J. Kellock;J. U. Thiele

Comments

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Abbreviated Journal Title

J. Appl. Phys.

Keywords

FEPT THIN-FILMS; GROWTH TEMPERATURE-DEPENDENCE; COPT; COERCIVITY; Physics, Applied

Abstract

The order parameters and anisotropy constants of a series of epitaxial L1(0) FePt films with compositions in the range of 45-55 at. % Fe and nominal thicknesses of 50 nm have been characterized. The films were made by cosputtering the elements onto single crystal MgO(001) substrates. The substrates were coated with 1 nm Pt/1 nm Fe bilayer seeds prior to alloy deposition. Both the bilayer seed and the alloy film were deposited at 620 degreesC. Lattice and order parameters were obtained by x-ray diffraction. Film compositions and thicknesses were determined by Rutherford backscattering spectrometry, and room-temperature magnetocrystalline anisotropies were determined with a torque magnetometer. It was found that the order parameter had a maximum for the film composition closest to the equiatomic composition, whereas the magnetocrystalline anisotropy increased as the Fe content increased from below to slightly above the equiatomic composition. These results imply that nonstoichiometric FePt compositions, with a slight excess of Fe, may in fact be preferred for applications that require high anisotropy.

Journal Title

Journal of Applied Physics

Volume

95

Issue/Number

11

Publication Date

1-1-2004

Document Type

Article; Proceedings Paper

Language

English

First Page

7501

Last Page

7503

WOS Identifier

WOS:000221657900323

ISSN

0021-8979

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