Authors

O. Lopatiuk-Tirpak; L. Chernyak; L. J. Mandalapu; Z. Yang; J. L. Liu; K. Gartsman; Y. Feldman;Z. Dashevsky

Comments

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"This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in the linked citation and may be found originally at Applied Physics Letters."

Abbreviated Journal Title

Appl. Phys. Lett.

Keywords

P-TYPE ZNO; FILMS; Physics, Applied

Abstract

Forward bias electron injection into the p side of a p-n homojunction was shown to result in an improved response of the ZnO photodiodes. Injection of about 25 C of charge yielded a nearly 2.5-fold increase of photocurrent at 350 nm. This improvement was correlated with the increase of the diffusion length of minority electrons in p-type ZnO:Sb as determined by electron beam induced current measurements. It is suggested that the increase of the diffusion length is related to the carrier trapping on nonionized acceptor levels.

Journal Title

Applied Physics Letters

Volume

89

Issue/Number

14

Publication Date

1-1-2006

Document Type

Article

Language

English

First Page

3

WOS Identifier

WOS:000241056900059

ISSN

0003-6951

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