Title
Focused ion beam milling: A method of site-specific sample extraction for microanalysis of Earth and planetary materials
Abbreviated Journal Title
Am. Miner.
Keywords
Geochemistry & Geophysics; Mineralogy
Abstract
Argon ion milling is the conventional means by which mineral sections are thinned to electron transparency for transmission electron microscope (TEM) analysis, but this technique exhibits significant shortcomings. In particular. selective thinning and imaging of submicrometer inclusions during sample milling are highly problematic. We have achieved successful results using the focused ion beam (FIB) lift-out technique, which utilizes a 30 kV Ga+ ion beam to extract electron transparent specimens with nanometer scale precision. Using this procedure, we have prepared a number of Earth materials representing a range of structures and compositions for TEM analysis. We believe that FIB milling will create major new opportunities in the field of Earth and planetary materials microanalysis, particularly with respect to ultraprecious mineral and rock samples.
Journal Title
American Mineralogist
Volume
86
Issue/Number
9
Publication Date
1-1-2001
Document Type
Article
Language
English
First Page
1094
Last Page
1099
WOS Identifier
ISSN
0003-004X
Recommended Citation
"Focused ion beam milling: A method of site-specific sample extraction for microanalysis of Earth and planetary materials" (2001). Faculty Bibliography 2000s. 8024.
https://stars.library.ucf.edu/facultybib2000/8024
Comments
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