Piezospectroscopic Measurements Capturing the Evolution of Plasma Spray-Coating Stresses with Substrate Loads

    Authors

    G. Freihofer; D. Fugon-Dessources; E. Ergin; A. Van Newkirk; A. Gupta; S. Seal; A. Schulzgen;S. Raghavan

    Comments

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    Abbreviated Journal Title

    ACS Appl. Mater. Interfaces

    Keywords

    piezospectroscopy; plasma-spray; coating; stress; mechanical testing; photo-luminescence; COMPOSITE COATINGS; ALUMINA COATINGS; CERAMIC COATINGS; IN-SITU; BEHAVIOR; FLUORESCENCE; OXIDE; MICROSTRUCTURE; COMPRESSION; DEPENDENCE; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary

    Abstract

    Plasma-spray coatings have a unique microstructure composed of various types of microcracks and weakly bonded interfaces which dictate their nonlinear mechanical properties. The intrinsic photo-luminescence (PL) characteristics of alpha-alumina (alpha-Al2O3) within these coatings offer a diagnostic functionality, enabling these properties to be probed experimentally at the microscale, under substrate loading. The piczospectroscopic (PS) measurements from the coatings are capable of revealing microstructural stress at high spatial resolution. Here, for the first time, the evolution of stresses within air plasma spray (APS) coatings under increasing substrate loads were captured using piezospectroscopy. With mechanical cycling of the substrate, the PS properties revealed anelastic and inelastic behavior and a relaxation of residual tensile stress within the APS coatings. With decreasing substrate thickness, the coating was observed to sustain more stress, as the substrate's influence on the mechanical behavior decreased. The findings provide an insight into the microstructural response that can serve as the basis for model validation and subsequently drive the design process for these coatings.

    Journal Title

    Acs Applied Materials & Interfaces

    Volume

    6

    Issue/Number

    3

    Publication Date

    1-1-2014

    Document Type

    Article

    Language

    English

    First Page

    1366

    Last Page

    1369

    WOS Identifier

    WOS:000331493200006

    ISSN

    1944-8244

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