Combined AFM and STM measurements of a silicene sheet grown on the Ag(111) surface

    Authors

    Z. Majzik; M. R. Tchalala; M. Svec; P. Hapala; H. Enriquez; A. Kara; A. J. Mayne; G. Dujardin; P. Jelinek;H. Oughaddou

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    Abbreviated Journal Title

    J. Phys.-Condes. Matter

    Keywords

    ATOMIC-FORCE MICROSCOPY; NANOTUBES; Physics, Condensed Matter

    Abstract

    In this paper, we present the first non-contact atomic force microscopy (nc-AFM) of a silicene on a silver (Ag) surface, obtained by combining non-contact atomic force microscopy and scanning tunneling microscopy (STM). STM images over large areas of silicene grown on the Ag(111) surface show both (root 13 x root 13)R13.9 degrees and (4 x 4) superstructures. For the widely observed (4 x 4) structure, the observed nc-AFM image is very similar to the one recorded by STM. The structure resolved by nc-AFM is compatible with only one out of two silicon atoms being visible. This indicates unambiguously a strong buckling of the silicene honeycomb layer.

    Journal Title

    Journal of Physics-Condensed Matter

    Volume

    25

    Issue/Number

    22

    Publication Date

    1-1-2013

    Document Type

    Article

    Language

    English

    First Page

    5

    WOS Identifier

    WOS:000319262200007

    ISSN

    0953-8984

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