Combined AFM and STM measurements of a silicene sheet grown on the Ag(111) surface
Abbreviated Journal Title
J. Phys.-Condes. Matter
ATOMIC-FORCE MICROSCOPY; NANOTUBES; Physics, Condensed Matter
In this paper, we present the first non-contact atomic force microscopy (nc-AFM) of a silicene on a silver (Ag) surface, obtained by combining non-contact atomic force microscopy and scanning tunneling microscopy (STM). STM images over large areas of silicene grown on the Ag(111) surface show both (root 13 x root 13)R13.9 degrees and (4 x 4) superstructures. For the widely observed (4 x 4) structure, the observed nc-AFM image is very similar to the one recorded by STM. The structure resolved by nc-AFM is compatible with only one out of two silicon atoms being visible. This indicates unambiguously a strong buckling of the silicene honeycomb layer.
Journal of Physics-Condensed Matter
"Combined AFM and STM measurements of a silicene sheet grown on the Ag(111) surface" (2013). Faculty Bibliography 2010s. 4366.