Title

Power amplifier resilient design for process, voltage, and temperature variations

Authors

Authors

J. S. Yuan;E. Kritchanchai

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

Microelectron. Reliab.

Keywords

Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Physics, Applied

Abstract

This paper presents RF power amplifier adaptive body bias compensation technique for output power and power-added efficiency resilient to process, supply voltage, and temperature (PVT) variations. The adaptive body biasing scheme uses a current source for PVT sensing to provide resilience through the threshold voltage adjustment to maintain power amplifier performance over a wide range of variability. Analytical equations are derived for physical insight. ADS simulation results show that the resilient body biasing design improves the robustness of the power amplifier in output power and power-added efficiency over process, supply voltage, and temperature variations. (C) 2013 Elsevier Ltd. All rights reserved.

Journal Title

Microelectronics Reliability

Volume

53

Issue/Number

6

Publication Date

1-1-2013

Document Type

Article

Language

English

First Page

856

Last Page

860

WOS Identifier

WOS:000320424800010

ISSN

0026-2714

Share

COinS