Title
Miscorrelation Between Air Gap Discharge and Human Metal Model Stresses Due to Multi-Finger Turn-On Effect
Abbreviated Journal Title
IEEE Trans. Device Mater. Reliab.
Keywords
ESD; non-uniform triggering; mix-mode simulation; IEC; HMM; NLDMOS-SCR; Engineering, Electrical & Electronic; Physics, Applied
Abstract
Operation of NLDMOS-SCR devices under the human metal model (HMM) and IEC air gap electrostatic discharge (ESD) stresses has been studied based on both the pulsed measurements and mixed-mode simulations. Under the IEC air gap testing, the devices are found to suffer the non-uniform multi-finger turn-on behavior and hence a relatively low passing level, whereas both the IEC contact and HMM stresses do not give rise to such an adversary effect and result in a considerably higher passing level. It is further shown that the non-uniform multi-finger turn-on effect depends on the stress pulse rise time. Such dependence has also been examined and verified using the transmission line pulsing (TLP) technique with rise times ranging from 10 to 40 ns.
Journal Title
Ieee Transactions on Device and Materials Reliability
Volume
14
Issue/Number
3
Publication Date
1-1-2014
Document Type
Article
Language
English
First Page
864
Last Page
868
WOS Identifier
ISSN
1530-4388
Recommended Citation
"Miscorrelation Between Air Gap Discharge and Human Metal Model Stresses Due to Multi-Finger Turn-On Effect" (2014). Faculty Bibliography 2010s. 6302.
https://stars.library.ucf.edu/facultybib2010/6302
Comments
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