Miscorrelation Between Air Gap Discharge and Human Metal Model Stresses Due to Multi-Finger Turn-On Effect

    Authors

    Y. F. Xi; S. Malobabic; V. Vashchenko;J. J. Liou

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abbreviated Journal Title

    IEEE Trans. Device Mater. Reliab.

    Keywords

    ESD; non-uniform triggering; mix-mode simulation; IEC; HMM; NLDMOS-SCR; Engineering, Electrical & Electronic; Physics, Applied

    Abstract

    Operation of NLDMOS-SCR devices under the human metal model (HMM) and IEC air gap electrostatic discharge (ESD) stresses has been studied based on both the pulsed measurements and mixed-mode simulations. Under the IEC air gap testing, the devices are found to suffer the non-uniform multi-finger turn-on behavior and hence a relatively low passing level, whereas both the IEC contact and HMM stresses do not give rise to such an adversary effect and result in a considerably higher passing level. It is further shown that the non-uniform multi-finger turn-on effect depends on the stress pulse rise time. Such dependence has also been examined and verified using the transmission line pulsing (TLP) technique with rise times ranging from 10 to 40 ns.

    Journal Title

    Ieee Transactions on Device and Materials Reliability

    Volume

    14

    Issue/Number

    3

    Publication Date

    1-1-2014

    Document Type

    Article

    Language

    English

    First Page

    864

    Last Page

    868

    WOS Identifier

    WOS:000341984600011

    ISSN

    1530-4388

    Share

    COinS