Authors

D. J. Shelton; K. R. Coffey;G. D. Boreman

Comments

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Abbreviated Journal Title

Opt. Express

Keywords

DIOXIDE THIN-FILMS; VANADIUM DIOXIDE; OPTICAL-PROPERTIES; VO2; TRANSITION; SURFACE; MICROSTRUCTURE; DEPOSITION; DESIGN; Optics

Abstract

For the first time, a tunable reflected phase reflectarray is demonstrated in the thermal infrared. This is done using thermochromic VO2 square-patch elements in a reflectarray metamaterial configuration. A sixty degree change in reflected phase is measured using a Twyman-Green interferometer, and FTIR measurements show that the resonance reflection minima shifts from 9.2 to 11.2 mu m as the sample is heated from 45 through 65 degrees C. These results are in agreement with finite-element method simulations using the optical properties of VO2 which are measured by infrared ellipsometry.

Journal Title

Optics Express

Volume

18

Issue/Number

2

Publication Date

1-1-2010

Document Type

Article

Language

English

First Page

1330

Last Page

1335

WOS Identifier

WOS:000273860400102

ISSN

1094-4087

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