Spectral interferometry for measuring dispersion in femtosecond diode lasers optics

Abstract

The objective is to develop and test a spectral interferometric technique that enables measurements of dispersion and absorption of optical devices. This technique is an improved and inexpensive way to characterize materials as compared to measurements using direct time domain methods and spectrophotometers. The importance of this work is that it provides a simple way to examine the effects of light propagation in the optical components which will be used in future telecommunication systems(Delfyett, 1996).

Notes

This item is only available in print in the UCF Libraries. If this is your thesis or dissertation, you can help us make it available online for use by researchers around the world by STARS for more information.

Thesis Completion

1996

Semester

Fall

Advisor

Delfyett, Peter

Degree

Bachelor of Science (B.S.)

College

College of Engineering

Degree Program

Electrical and Computer Engineering

Subjects

Dissertations, Academic -- Engineering;Engineering -- Dissertations, Academic

Format

Print

Identifier

DP0021458

Language

English

Access Status

Open Access

Length of Campus-only Access

None

Document Type

Honors in the Major Thesis

This document is currently not available here.

Share

COinS