Polishing studies on tantalum barrier layer in copper chemical mechanical planarization
Keywords
Copper; Grinding and polishing; Impedance spectroscopy; Tantalum
Notes
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Graduation Date
2003
Advisor
Sundaram, Kalpathy B.
Degree
Master of Science (M.S.)
College
College of Engineering
Department
Electrical Engineering and Computer Science
Format
Pages
97 p.
Language
English
Length of Campus-only Access
None
Access Status
Masters Thesis (Open Access)
Subjects
Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic
STARS Citation
Vijayakumar, Arun, "Polishing studies on tantalum barrier layer in copper chemical mechanical planarization" (2003). Retrospective Theses and Dissertations. 1062.
https://stars.library.ucf.edu/rtd/1062