Analysis of the reliability of A1GaAs/GaAs HBTs based on device simulation

Keywords

ATLAS (Computer program language), Bipolar transistors

Notes

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Graduation Date

Spring 2001

Advisor

Liou, Juin J.

Degree

Master of Science (M.S.)

College

College of Engineering and Computer Science

Department

Electrical Engineering and Computer Science

Format

Print

Language

English

Length of Campus-only Access

None

Access Status

Masters Thesis (Open Access)

Subjects

Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic

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