Title
Gate oxide integrity for deep submicron CMOS device/circuit reliability
Keywords
Metal oxide semiconductors, Complementary Metal oxide semiconductors
Notes
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Graduation Date
Spring 2001
Advisor
Yuan, Jiann S.
Degree
Doctor of Philosophy (Ph.D.)
College
College of Engineering and Computer Science
Department
Electrical Engineering and Computer Science
Format
Language
English
Length of Campus-only Access
None
Access Status
Doctoral Dissertation (Open Access)
Subjects
Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic
STARS Citation
Zhang, Jinlong, "Gate oxide integrity for deep submicron CMOS device/circuit reliability" (2001). Retrospective Theses and Dissertations. 1417.
https://stars.library.ucf.edu/rtd/1417