Title

Gate oxide integrity for deep submicron CMOS device/circuit reliability

Author

Jinlong Zhang, University of Central Florida

Keywords

Metal oxide semiconductors, Complementary Metal oxide semiconductors

Notes

This item is only available in print in the UCF Libraries. If this is your thesis or dissertation, you can help us make it available online for use by researchers around the world by downloading and filling out the Internet Distribution Consent Agreement. You may also contact the project coordinator Kerri Bottorff for more information.

Graduation Date

Spring 2001

Advisor

Yuan, Jiann S.

Degree

Doctor of Philosophy (Ph.D.)

College

College of Engineering and Computer Science

Department

Electrical Engineering and Computer Science

Format

Print

Language

English

Length of Campus-only Access

None

Access Status

Doctoral Dissertation (Open Access)

Subjects

Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic

STARS Citation

Zhang, Jinlong, "Gate oxide integrity for deep submicron CMOS device/circuit reliability" (2001). Retrospective Theses and Dissertations. 1417.
https://stars.library.ucf.edu/rtd/1417