Keywords

Cluster analysis, Pattern perception, Unsupervised learning, Hierarchical clustering, Similarity measures (distance metrics), Feature extraction and representation, Cluster validity and evaluation

Abstract

During the past decade and a half, there has been a considerable growth of interest in problems of pattern recognition. Contributions to the growth have been from many of the disciplines including statistics, control theory, operations research, biology, linguistics, and computer science. One of the basic approaches to pattern recognition is cluster analysis, in which various methodologies may be successfully employed. It is the purpose of this research report to investigate some of the basic clustering concepts in automatic pattern recognition.

Notes

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Graduation Date

1975

Advisor

Lindenberg, Klaus

Degree

Master of Science (M.S.)

College

College of Engineering

Format

PDF

Pages

57 pages

Language

English

Rights

Public Domain

Length of Campus-only Access

None

Access Status

Masters Thesis (Open Access)

Identifier

DP0012690

Subjects

Cluster analysis; Pattern perception; Cluster analysis--Mathematical models; Pattern recognition systems--Statistical methods; Pattern recognition systems--Computer programs; Automatic classification

Collection (Linked data)

Retrospective Theses and Dissertations

Accessibility Status

Searchable text

Included in

Engineering Commons

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