Testing of the delay-insensitive asynchronous circuits

Keywords

Asynchronous circuits, Integrated circuits -- Very large scale integration -- Design and construction

Notes

This item is only available in print in the UCF Libraries. If this is your thesis or dissertation, you can help us make it available online for use by researchers around the world by STARS for more information.

Graduation Date

Summer 2000

Advisor

Yuan, Jiann S.

Degree

Master of Science (M.S.)

College

College of Engineering

Department

Electrical Engineering and Computer Science

Format

Print

Language

English

Length of Campus-only Access

None

Access Status

Masters Thesis (Open Access)

Subjects

Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic

This document is currently not available here.

Share

COinS