Development of improved methodology for characterization and simulation of electrostatic discharge (ESD) in mos devices and ICS

Author

Jui Chu Lee, University of Central Florida

Keywords

Electric discharges, Electrostatics

Notes

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Graduation Date

Summer 2000

Advisor

Liou, Juin J.

Degree

Doctor of Philosophy (Ph.D.)

College

College of Engineering

Department

Electrical Engineering and Computer Science

Format

Print

Language

English

Length of Campus-only Access

None

Access Status

Doctoral Dissertation (Open Access)

Subjects

Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic

STARS Citation

Lee, Jui Chu, "Development of improved methodology for characterization and simulation of electrostatic discharge (ESD) in mos devices and ICS" (2000). Retrospective Theses and Dissertations. 1906.
https://stars.library.ucf.edu/rtd/1906