An investigation of transmission electron microscopy specimen artifacts resulting from focused ion beam and conventional preparation techniques

Keywords

Ion bombardment, Transmission electron microscopy

Notes

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Graduation Date

Spring 2000

Advisor

Giannuzzi, Lucille A.

Degree

Master of Science (M.S.)

College

College of Engineering

Department

Mechanical, Materials, and Aerospace Engineering

Format

Print

Language

English

Length of Campus-only Access

None

Access Status

Masters Thesis (Open Access)

Subjects

Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic

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