RNN based wafer surface reconstruction from scanning electron microscopy images

Keywords

Image processing, Neural networks (Computer science), Semiconductors -- Surfaces

Notes

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Graduation Date

Fall 2000

Advisor

Gelenbe, Erol

Degree

Master of Science (M.S.)

College

College of Engineering

Department

Electrical Engineering and Computer Science

Degree Program

Computer Science

Format

Print

Language

English

Length of Campus-only Access

None

Access Status

Masters Thesis (Open Access)

Subjects

Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic

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