Hot-carrier effects in submicron mosfets including gate-oxide thickness dependence/

Notes

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Graduation Date

1996

Semester

Summer

Advisor

Yuan, Jiann S.

Degree

Master of Science (M.S.)

College

College of Engineering

Department

Electrical and Computer Engineering

Degree Program

Electrical Engineering

Format

Print

Language

English

Length of Campus-only Access

None

Access Status

Masters Thesis (Open Access)

Subjects

Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic

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