Hot-carrier effects in submicron mosfets including gate-oxide thickness dependence/
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Yuan, Jiann S.
Master of Science (M.S.)
College of Engineering
Electrical and Computer Engineering
Length of Campus-only Access
Masters Thesis (Open Access)
Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic
Gu, Yuhua, "Hot-carrier effects in submicron mosfets including gate-oxide thickness dependence/" (1996). Retrospective Theses and Dissertations. 2937.