Excursion Areas of Intensity Due to Random Optical Waves

Abstract

This study approximates the expected area of excursion regions due to a random intensity. The statistical analysis involves the concepts of two dimensional level crossings and the statistics and spatial spectral properties of the intensity. The analysis is general and estimates the area of each excursion region for any two dimensional gamma distributed random process. Applications discussed include coherent imaging, conventional imaging, and damage areas on laser illuminated materials.

Notes

This item is only available in print in the UCF Libraries. If this is your thesis or dissertation, you can help us make it available online for use by researchers around the world by STARS for more information.

Graduation Date

1990

Semester

Summer

Advisor

Phillips, Ronald

Degree

Master of Science (M.S.)

College

College of Engineering

Department

Electrical Engineering and Communication Sciences

Degree Program

Electrical Engineering

Format

PDF

Pages

79 p.

Language

English

Length of Campus-only Access

None

Access Status

Masters Thesis (Open Access)

Identifier

DP0027309

Subjects

Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic

Accessibility Status

Searchable text

This document is currently not available here.

Share

COinS