Excursion Areas of Intensity Due to Random Optical Waves
Abstract
This study approximates the expected area of excursion regions due to a random intensity. The statistical analysis involves the concepts of two dimensional level crossings and the statistics and spatial spectral properties of the intensity. The analysis is general and estimates the area of each excursion region for any two dimensional gamma distributed random process. Applications discussed include coherent imaging, conventional imaging, and damage areas on laser illuminated materials.
Notes
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Graduation Date
1990
Semester
Summer
Advisor
Phillips, Ronald
Degree
Master of Science (M.S.)
College
College of Engineering
Department
Electrical Engineering and Communication Sciences
Degree Program
Electrical Engineering
Format
Pages
79 p.
Language
English
Length of Campus-only Access
None
Access Status
Masters Thesis (Open Access)
Identifier
DP0027309
Subjects
Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic
STARS Citation
Kragh, Frank E., "Excursion Areas of Intensity Due to Random Optical Waves" (1990). Retrospective Theses and Dissertations. 4017.
https://stars.library.ucf.edu/rtd/4017
Accessibility Status
Searchable text