Excursion Areas of Intensity Due to Random Optical Waves
This study approximates the expected area of excursion regions due to a random intensity. The statistical analysis involves the concepts of two dimensional level crossings and the statistics and spatial spectral properties of the intensity. The analysis is general and estimates the area of each excursion region for any two dimensional gamma distributed random process. Applications discussed include coherent imaging, conventional imaging, and damage areas on laser illuminated materials.
This item is only available in print in the UCF Libraries. If this is your thesis or dissertation, you can help us make it available online for use by researchers around the world by downloading and filling out the Internet Distribution Consent Agreement. You may also contact the project coordinator Kerri Bottorff for more information.
Master of Science (M.S.)
College of Engineering
Electrical Engineering and Communication Sciences
Length of Campus-only Access
Masters Thesis (Open Access)
Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic
Kragh, Frank E., "Excursion Areas of Intensity Due to Random Optical Waves" (1990). Retrospective Theses and Dissertations. 4017.