High resolution photoelectron spectrometry of selected ns' and nd' autoionization resonances in Ar, Kr, and Xe
Abstract
Photoionization cross sections (a) and photoelectron angular distribution parameters (~) across selected (ns' ,nd') autoionization resonances in Ar, Kr, and Xe have been measured with photon resolution widths as low as 0.023A by means of synchrotron-based photoelectron spectroscopy. obtained by The other experimental results are compared with those experimental techniques and theoretical results. The enhanced resolution allows a redetermination of the width of the ns' resonances.
Notes
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Graduation Date
1990
Semester
Spring
Advisor
Caldwell, C. Denise
Degree
Master of Science (M.S.)
College
College of Arts and Sciences
Department
Physics
Format
Pages
39 p.
Language
English
Length of Campus-only Access
None
Access Status
Masters Thesis (Open Access)
Identifier
DP0027757
Subjects
Arts and Sciences -- Dissertations, Academic; Dissertations, Academic -- Arts and Sciences
STARS Citation
Wu, Jian Zhong, "High resolution photoelectron spectrometry of selected ns' and nd' autoionization resonances in Ar, Kr, and Xe" (1990). Retrospective Theses and Dissertations. 4097.
https://stars.library.ucf.edu/rtd/4097
Accessibility Status
Searchable text