High resolution photoelectron spectrometry of selected ns' and nd' autoionization resonances in Ar, Kr, and Xe

Abstract

Photoionization cross sections (a) and photoelectron angular distribution parameters (~) across selected (ns' ,nd') autoionization resonances in Ar, Kr, and Xe have been measured with photon resolution widths as low as 0.023A by means of synchrotron-based photoelectron spectroscopy. obtained by The other experimental results are compared with those experimental techniques and theoretical results. The enhanced resolution allows a redetermination of the width of the ns' resonances.

Notes

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Graduation Date

1990

Semester

Spring

Advisor

Caldwell, C. Denise

Degree

Master of Science (M.S.)

College

College of Arts and Sciences

Department

Physics

Format

PDF

Pages

39 p.

Language

English

Length of Campus-only Access

None

Access Status

Masters Thesis (Open Access)

Identifier

DP0027757

Subjects

Arts and Sciences -- Dissertations, Academic; Dissertations, Academic -- Arts and Sciences

Accessibility Status

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