High resolution photoelectron spectrometry of selected ns' and nd' autoionization resonances in Ar, Kr, and Xe
Photoionization cross sections (a) and photoelectron angular distribution parameters (~) across selected (ns' ,nd') autoionization resonances in Ar, Kr, and Xe have been measured with photon resolution widths as low as 0.023A by means of synchrotron-based photoelectron spectroscopy. obtained by The other experimental results are compared with those experimental techniques and theoretical results. The enhanced resolution allows a redetermination of the width of the ns' resonances.
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Caldwell, C. Denise
Master of Science (M.S.)
College of Arts and Sciences
Length of Campus-only Access
Masters Thesis (Open Access)
Arts and Sciences -- Dissertations, Academic; Dissertations, Academic -- Arts and Sciences
Wu, Jian Zhong, "High resolution photoelectron spectrometry of selected ns' and nd' autoionization resonances in Ar, Kr, and Xe" (1990). Retrospective Theses and Dissertations. 4097.