Simulation of digital circuit for testing

Abstract

Semiconductor technology has made significant progress in the past two decades. As a result, manufacturers are squeezing more components onto printed circuit boards, which in turn reduces testability. The cost of testing has become a major part of the cost of developing and maintaining a system. Since the early 70's, logic simulation has evolved to become the most effective means of testing digital circuit boards. This paper will cover the major aspects of digital logic simulation. The first chapter is an introduction to the subject matter. Chapter two presents the basic principles of digital testing. Chapt~r three covers the logic model elements. Chapter four discusses the rules associated with modeling and simulating faults. Chapter five considers the techniques of test pattern generation. A concluding remark assesses the future direction of digital testing. A digital logic simulation example model which includes a circuit diagram, the computer model, the stimulus/response patterns, pattern/pin-to-faultisolation- set cross reference table, a fault isolation set table, a node detection statistics table, and a fault isolation statistics table are provided in the Appendices.

Notes

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Graduation Date

1989

Semester

Spring

Advisor

Walker, Robert L.

Degree

Master of Science (M.S.)

College

College of Engineering

Department

Electrical Engineering and Communication Sciences

Format

PDF

Pages

84 p.

Language

English

Length of Campus-only Access

None

Access Status

Masters Thesis (Open Access)

Identifier

DP0027225

Subjects

Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic

Accessibility Status

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