Abstract
This paper presents an alternative approach in providing uniformity correction for an infrared focal plane array by utilizing analog MOSFET circuitry. This technology is compatible with modern VLSI production and is capable of enhanced operation at cryogenic temperatures. The method presented here is a potential contribution to the growing list of special analog circuit configurations which may be incorporated for on-chip signal processing, inside the cryogenic dewar assembly. Electronic packaging of current thermal systems could be significantly reduced in size and weight by trading some of the cumbersome digital algorithms and complex post-processing circuitry for implementation in VLSI form.
The proposed method employs capacitor storage of the thermal reference voltages to correct for the Responsivity and Bias of each detector channel. This compensation for gain and level can be achieved in real operating time using a background subtraction technique and feedback which features pulse-width modulation of the detector's elemental integration period.
Notes
If this is your thesis or dissertation, and want to learn how to access it or for more information about readership statistics, contact us at STARS@ucf.edu
Graduation Date
1988
Semester
Fall
Advisor
Martin, Robert J.
Degree
Master of Science (M.S.)
College
College of Engineering
Department
Electrical Engineering and Communication Sciences
Format
Pages
84 p.
Language
English
Rights
Public Domain
Length of Campus-only Access
None
Access Status
Masters Thesis (Open Access)
Identifier
DP0022064
Subjects
Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic
STARS Citation
Heinold, George C., "Uniformity correction for a scanned long wavelength infrared focal plane array" (1988). Retrospective Theses and Dissertations. 4286.
https://stars.library.ucf.edu/rtd/4286
Accessibility Status
Searchable text