This paper presents an alternative approach in providing uniformity correction for an infrared focal plane array by utilizing analog MOSFET circuitry. This technology is compatible with modern VLSI production and is capable of enhanced operation at cryogenic temperatures. The method presented here is a potential contribution to the growing list of special analog circuit configurations which may be incorporated for on-chip signal processing, inside the cryogenic dewar assembly. Electronic packaging of current thermal systems could be significantly reduced in size and weight by trading some of the cumbersome digital algorithms and complex post-processing circuitry for implementation in VLSI form.
The proposed method employs capacitor storage of the thermal reference voltages to correct for the Responsivity and Bias of each detector channel. This compensation for gain and level can be achieved in real operating time using a background subtraction technique and feedback which features pulse-width modulation of the detector's elemental integration period.
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Martin, Robert J.
Master of Science (M.S.)
College of Engineering
Electrical Engineering and Communication Sciences
Length of Campus-only Access
Masters Thesis (Open Access)
Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic
Heinold, George C., "Uniformity correction for a scanned long wavelength infrared focal plane array" (1988). Retrospective Theses and Dissertations. 4286.