Abstract
A two-port device can be described by the incident and reflected voltages at each port. The parameters used in this description are known as scattering parameters. Accurate measurement of the values are thus important in device evaluation and network design. Limitations arise with the measurement capability of the equipment. In order to reduce these limitations, the data acquisition is controlled remotely by a computer program. The program also offers an error correction analysis of the measurement results. The measurement setup and basic approach are discussed as well as the techniques of normalization and calibration of each scattering parameter. The computer program offers three methods of data acquisition which are presented in detail. Results of device testing and error analysis are presented.
Notes
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Graduation Date
1987
Semester
Fall
Advisor
Malocha, Donald C.
Degree
Master of Science (M.S.)
College
College of Engineering
Format
Pages
121 p.
Language
English
Rights
Public Domain
Length of Campus-only Access
None
Access Status
Doctoral Dissertation (Open Access)
Identifier
DP0021497
STARS Citation
Douglas, Sallie Layton, "Remote Data Acquisition and Error Analysis of the Scattering Parameters of Quartz Crystal Devices" (1987). Retrospective Theses and Dissertations. 5085.
https://stars.library.ucf.edu/rtd/5085
Contributor (Linked data)
University of Central Florida. College of Engineering [VIAF]
Accessibility Status
Searchable text