Keywords

Pattern recognition systems, Random access memory, Adjacent-pattern interference faults (APIFs), Pattern-sensitive faults, Optimal test algorithm, Memory operation minimization, RAM test sequence model

Abstract

Random-access memory (RAM) testing to detect unrestricted pattern-sensitive faults (PSFs) is impractical due to the size of the memory checking sequence required. A formal model for restricted PSFs in RAMs called adjacent-pattern interference faults (APIFs) is presented. A test algorithm capable of detecting APIFs in RAMs requiring a minimum number of memory operations is then developed.

Notes

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Graduation Date

Fall 1981

Advisor

Linton, Darrell G.

Degree

Master of Science (M.S.)

College

College of Engineering

Degree Program

Engineering

Format

PDF

Pages

85 pages

Language

English

Rights

Public Domain

Length of Campus-only Access

None

Access Status

Masters Thesis (Open Access)

Identifier

DP0013586

Subjects

Random access memory--Testing; Automatic test pattern generation; Semiconductor storage devices--Testing; Digital integrated circuits--Testing; Integrated circuits--Very large scale integration--Defects--Mathematical models

Accessibility Status

Searchable text

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This item was created or digitized prior to April 24, 2026, or is a reproduction of legacy media created before that date. It is preserved in its original, unmodified state specifically for research, reference, or historical recordkeeping. In accordance with the ADA Title II Final Rule, the University Libraries provides accessible versions of archival materials upon request. To request an accommodation for this item, please submit an accessibility request form.