An Optimal Algorithm for Detecting Pattern Sensitive Faults in Semiconductor Random Access Memories

Author

Richard I. Subrin, University of Central Florida

Keywords

Pattern recognition systems, Random access memory

Abstract

Random-access memory (RAM) testing to detect unrestricted pattern-sensitive faults (PSFs) is impractical due to the size of the memory checking sequence required. A formal model for restricted PSFs in RAMs called adjacent-pattern interference faults (APIFs) is presented. A test algorithm capable of detecting APIFs in RAMs requiring a minimum number of memory operations is then developed.

Notes

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Graduation Date

Fall 1981

Advisor

Linton, Darrell G.

Degree

Master of Science (M.S.)

College

College of Engineering

Degree Program

Engineering

Format

PDF

Pages

85 p.

Language

English

Rights

Public Domain

Length of Campus-only Access

None

Access Status

Masters Thesis (Open Access)

Identifier

DP0013586

STARS Citation

Subrin, Richard I., "An Optimal Algorithm for Detecting Pattern Sensitive Faults in Semiconductor Random Access Memories" (1981). Retrospective Theses and Dissertations. 596.
https://stars.library.ucf.edu/rtd/596

Contributor (Linked data)

Darrell G. Linton (Q59273636)

University of Central Florida. College of Engineering [VIAF]

University of Central Florida. College of Engineering [LC]

Accessibility Status

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