An in situ synchrotron X-ray diffraction study of stress-induced transformations in NiTi
Keywords
Shape memory alloys; X rays -- Diffraction
Notes
This item is only available in print in the UCF Libraries. If this is your thesis or dissertation, you can help us make it available online for use by researchers around the world by STARS for more information.
Graduation Date
Spring 2003
Advisor
Vaidyanathan, Rajan
Degree
Master of Science (M.S.)
College
College of Engineering
Department
Mechanical, Materials, and Aerospace Engineering
Degree Program
Materials Science
Format
Pages
118 p.
Language
English
Length of Campus-only Access
None
Access Status
Masters Thesis (Open Access)
Subjects
Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic
STARS Citation
Rathod, Chandrasen, "An in situ synchrotron X-ray diffraction study of stress-induced transformations in NiTi" (2003). Retrospective Theses and Dissertations. 991.
https://stars.library.ucf.edu/rtd/991