Title
EZ-scan: Single beam measurement technique for thin-film nonlinearities
Abstract
The EZ-scan, an improved Z-scan technique, shows a sensitivity for measuring nonlinearly induced wavefront distortion of ≈Λ/104. We show that the nonlinear refraction and nonlinear absorption coeficients can be determined separately by a single EZ-scan measurement. We apply this technique to several organic thin films.
Publication Date
7-6-1994
Publication Title
Proceedings of SPIE - The International Society for Optical Engineering
Volume
2229
Number of Pages
148-156
Document Type
Article; Proceedings Paper
Identifier
scopus
Personal Identifier
scopus
DOI Link
https://doi.org/10.1117/12.179580
Copyright Status
Unknown
Socpus ID
3042966696 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/3042966696
STARS Citation
Xia, T.; Sheik-Bahae, M.; and Wang, Z., "EZ-scan: Single beam measurement technique for thin-film nonlinearities" (1994). Scopus Export 1990s. 128.
https://stars.library.ucf.edu/scopus1990/128