Title

Sensitive N2 Measurements Using A Single Beam

Keywords

BaF 2; CS 2; Experimental Technique; Kerr Effect; Nonlinear Refraction; Z-Scan

Abstract

We present a sensitive single beam technique for measuring nonlinear refraction in a variety of materials that offers simplicity, sensitivity and speed. The transmittance of a sample is measured through a finite aperture in the far-field as the sample is moved along the propagation path (z) of a focused Gaussian beam. The sign and magnitude of the nonlinearity is easily deduced from such a transmittance curve (Z-scan). Employing this technique a sensitivity of better than Λ/300 wavefront distortion is achieved in n2 measurements of BaFZ using picosecond visible laser pulses.

Publication Date

11-1-1990

Publication Title

Proceedings of SPIE - The International Society for Optical Engineering

Volume

1438

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1117/12.2294422

Socpus ID

85075520307 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85075520307

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