Title

Sensitive N2 Measurements Using A Single Beam

Abstract

We present a sensitive single beam technique for measuring nonlinear refraction in a variety of materials that offers simplicity, sensitivity and speed. The transmittance of a sample is measured through a finite aperture in the far-field as the sample is moved along the propagation path (z) of a focused Gaussian beam. The sign and magnitude of the nonlinearity is easily deduced from such a transmittance curve (Z-scan). Employing this technique a sensitivity of better than λ/300 wavefront distortion is achieved in n2 measurements of BaF2 using picosecond visible laser pulses.

Publication Date

10-1-1990

Publication Title

NIST Special Publication

Issue

801

Number of Pages

126-135

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

Socpus ID

0025495985 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0025495985

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