Title

Z-Scan: A Simple And Sensitive Technique For Nonlinear Refraction Measurements

Abstract

We describe a sensitive technique for measuring nonlinear refraction in a variety of materials that offers simplicity, sensitivity and speed. The transmittance of a sample is measured through a finite aperture in the far-field as the sample is moved along the propagation path (z) of a focused Gaussian beam. The sign and magnitude of the nonlinearity is easily deduced from such a transmittance curve (Z-scan). Employing this technique a sensitivity of better than λ/300 wavefront distortion is achieved in n2 measurements of BaF2 using picosecond frequency doubled Nd:YAG laser pulses. © 1990, SPIE.

Publication Date

1-4-1990

Publication Title

Proceedings of SPIE - The International Society for Optical Engineering

Volume

1148

Number of Pages

41-51

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1117/12.962142

Socpus ID

84957477990 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84957477990

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