Title
Current Transport In Algaas Gaas Heterojunction Bipolar Transistors Operating Between 300 And 500 K
Abstract
The current transport in AlGaAs GaAs heterojunction bipolar transistors (HBTs) operating in the temperature range of 300-500 K is investigated based on an analytical model including the lattice heating effect. It is found that an uneven increase in the base and collector currents gives rise to the current gain degradation at high temperatures. In addition, the study suggests that the effect of lattice heating becomes more important if the HBT area is reduced and/or the ambient temperature is increased. Experimental data and results simulated from a device simulator are included in support of our finding. © 1995.
Publication Date
1-1-1995
Publication Title
Solid State Electronics
Volume
38
Issue
10
Number of Pages
1759-1763
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1016/0038-1101(94)00295-Q
Copyright Status
Unknown
Socpus ID
29944444437 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/29944444437
STARS Citation
Ho, C. S.; Liou, J. J.; and Parthasarathy, A., "Current Transport In Algaas Gaas Heterojunction Bipolar Transistors Operating Between 300 And 500 K" (1995). Scopus Export 1990s. 1773.
https://stars.library.ucf.edu/scopus1990/1773