Title

Calculating Double-Exponential Diode Model Parameters From Previously Extracted Single-Exponential Model Parameters

Keywords

Diodes; Semiconductor device models

Abstract

A procedure is proposed to calculate both pre-exponential reverse currents of the double-exponential model of a diode's currentvoltage experimental characteristics from previously extracted reverse current and diode quality factor of the diode's singleexponential model. The procedure is illustrated by modelling the drain-body junction of a MOSFET including its parasitic series resistance. © 1995, IEE. All rights reserved.

Publication Date

1-5-1995

Publication Title

Electronics Letters

Volume

31

Issue

1

Number of Pages

71-72

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1049/el:19950030

Socpus ID

0029636108 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0029636108

This document is currently not available here.

Share

COinS