Title
Analysis Of The Validity Of Methods For Extracting The Effective Channel Length Of Short-Channel Ldd Mosfets
Publication Date
1-1-1996
Publication Title
Solid-State Electronics
Volume
39
Issue
7
Number of Pages
1093-1094
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1016/0038-1101(95)00421-1
Copyright Status
Unknown
Socpus ID
0030193608 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0030193608
STARS Citation
Latif, Z.; Liou, J. J.; and Ortiz-Conde, A., "Analysis Of The Validity Of Methods For Extracting The Effective Channel Length Of Short-Channel Ldd Mosfets" (1996). Scopus Export 1990s. 2307.
https://stars.library.ucf.edu/scopus1990/2307
COinS