Title
Silicon-Based Polarization Optics For The 1.30 And 1.55 Μm Communication Wavelengths
Abstract
A modular three-reflection prism of Si can be designed to function as an in-line (nondeviating) linear polarizer or quarterwave retarder at the 1.30 and 1.55 μm lightwave communication wavelengths. Si-related thin films are employed as optical coatings. In particular, a single-layer antireflection coating of Si3N4 is used at the entrance and exit faces, and a SiO2 film controls the polarization and total internal reflection phase shifts at the side surfaces of the prism. The angular and wavelength sensitivity of these proposed Si-based polarization optical elements is also considered.
Publication Date
5-1-1996
Publication Title
Journal of Lightwave Technology
Volume
14
Issue
5
Number of Pages
873-878
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/50.495170
Copyright Status
Unknown
Socpus ID
0030142406 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0030142406
STARS Citation
Azzam, R. M.A. and Howlader, M. M.K., "Silicon-Based Polarization Optics For The 1.30 And 1.55 Μm Communication Wavelengths" (1996). Scopus Export 1990s. 2495.
https://stars.library.ucf.edu/scopus1990/2495