Title

Infrared Reflection Polarizers Using Uniform And Diffuse Low-Index Layers Buried In High-Index Substrates

Abstract

The extinction ratio ER and the reflectance, or throughput, for the unextinguished s polarization Rs are calculated for infrared reflection polarizers that consist of a low-index transparent layer embedded in a high-index transparent substrate. Iso-ER and iso-Rs contours illustrate the dependence of the ER and Rs for a specific IR polarizer on the depth and width of a buried layer of SiO2 in Si at 3.5-μm wavelength and 80° angle of incidence. Both cases of a uniform layer with sharp boundaries and a diffuse Gaussian layer are considered. The diffuse-layer model employs Bruggeman's effective medium theory and is intended to simulate devices that are fabricated by the oxygen-ion implantation of Si. The angular and wavelength sensitivities of these polarizers are determined.

Publication Date

8-16-1996

Publication Title

Proceedings of SPIE - The International Society for Optical Engineering

Volume

2873

Number of Pages

148-151

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1117/12.246204

Socpus ID

85075913494 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85075913494

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