Title
A study of the validity of capacitance-based method for extracting the effective channel length of MOSFET's
Abstract
The capacitance-based method (C-V method) is a straight-forward method for extracting the effective channel length of MOSFET's. This paper investigates the validity of such a method based on results simulated from a two-dimensional (2-D) device simulator. The effective channel length extracted from the C-V method is also compared with those obtained from other methods reported in the literature. © 1997 IEEE.
Publication Date
12-1-1997
Publication Title
IEEE Transactions on Electron Devices
Volume
44
Issue
2
Number of Pages
340-343
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/16.557729
Copyright Status
Unknown
Socpus ID
0031079030 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0031079030
STARS Citation
Latif, Z.; Ortiz-Conde, A.; and Liou, J. J., "A study of the validity of capacitance-based method for extracting the effective channel length of MOSFET's" (1997). Scopus Export 1990s. 3156.
https://stars.library.ucf.edu/scopus1990/3156