Title
Structural Characterization Of Chalcogenide Planar Waveguide Materials Using Near-Infrared Raman Spectroscopy
Abstract
Chalcogenide glasses (ChG) based on As, S and Se are transparent in the infrared and have found applications in bulk, planar and fiber waveguide optical components. Due to their recent use in planar channel waveguide devices, a study to assess how structural variations imposed by processing conditions (film deposition) lead to changes in linear and nonlinear optical properties, is ongoing in our group. High resolution, near infrared (NIR) (λ = 840 nm) Raman spectroscopy has been employed to characterize changes in bonding between bulk glass specimens and glass in planar form. To obtain spectroscopic and spatially resolved information on chemical bonding, a microscope attachment has been constructed and is characterized as to its spatial resolution. Measurements are presented on single layer films prepared using processing and illumination conditions such as those used in fabricating waveguide components. These data are discussed in comparison to spectra obtained on bulk glass materials.
Publication Date
12-1-1999
Publication Title
Proceedings of SPIE - The International Society for Optical Engineering
Volume
3849
Number of Pages
74-84
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
0033323008 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0033323008
STARS Citation
Richardson, Kathleen A.; Zollinger, Kevin; and Evans, Jennifer, "Structural Characterization Of Chalcogenide Planar Waveguide Materials Using Near-Infrared Raman Spectroscopy" (1999). Scopus Export 1990s. 4246.
https://stars.library.ucf.edu/scopus1990/4246