Title
Chemical-Mechanical Planarization Of Copper: Role Of Oxidant And Inhibitor
Abstract
Investigations were carried out to understand the effect of hydrogen peroxide as an oxidant and benzotriazole (BTA) as an inhibitor on the chemical-mechanical planarization of copper using electrochemistry and dissolution studies. In the presence of glycine, copper dissolution rate was found to be very high in solution at pH 2 containing 5% H 2O 2 because of Cu-glycine complexation reaction. In such solution, addition of BTA effectively reduces Cu removal rate by the formation of Cu-BTA complex on the surface of copper that inhibits the dissolution. X-ray photoelectron spectroscopy and secondary ion mass spectroscopy investigations help understand the interaction of Cu-oxidant-inhibitor during polishing.
Publication Date
12-1-2003
Publication Title
Proceedings - Electrochemical Society
Volume
21
Number of Pages
52-60
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
3042768012 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/3042768012
STARS Citation
Kuiry, S. C.; Deshpande, S.; and Klimov, M., "Chemical-Mechanical Planarization Of Copper: Role Of Oxidant And Inhibitor" (2003). Scopus Export 2000s. 1382.
https://stars.library.ucf.edu/scopus2000/1382