Title
The Optical Signature Of Electron Injection In P-(Al)Gan
Keywords
Cathodoluminescence; Electron injection; GaN; III nitrides
Abstract
Electron injection into p-type (Al)GaN leads to a considerable (several-fold) decrease of the cathodoluminescence intensity at room and elevated temperatures. Cathodoluminescence measurements revealed a slower intensity decrease with increasing sample temperature and allowed an estimate of the activation energy for the effect to be obtained (192-232 meV), which is consistent with the values for Mg-acceptor thermal ionization in (Al)GaN. The electron injection-induced decay of the sample's luminescence which persists for at least several days at ∼300 K is, therefore, attributed to an injected electron trapping on a Mg level in the (Al)GaN forbidden gap. © 2004 Elsevier Ltd. All rights reserved.
Publication Date
1-1-2003
Publication Title
Superlattices and Microstructures
Volume
34
Issue
1-2
Number of Pages
55-62
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1016/j.spmi.2004.02.019
Copyright Status
Unknown
Socpus ID
10844275683 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/10844275683
STARS Citation
Burdett, W. C.; Lopatiuk, O.; and Osinsky, A., "The Optical Signature Of Electron Injection In P-(Al)Gan" (2003). Scopus Export 2000s. 2059.
https://stars.library.ucf.edu/scopus2000/2059