Title

Universality Of Mode-Locked Jitter Performance

Keywords

Active mode locking; Jitter; Semiconductor lasers

Abstract

It is shown experimentally that the jitter of actively mode-locked laser pulses is determined by two factors: first, by spontaneous noise associated with cavity loss, and second, by round-trip propagation time. As the round-trip time is increased, a characteristic frequency which defines the high-frequency limit of phase noise decreases. For a comparable round-trip time and cavity loss, the jitter of mode-locked lasers based on diverse gain media, whether semiconductor or erbium ion is universal and independent of the upper-state transition lifetime.

Publication Date

8-1-2002

Publication Title

IEEE Photonics Technology Letters

Volume

14

Issue

8

Number of Pages

1058-1060

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/LPT.2002.1021968

Socpus ID

0036684312 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0036684312

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